[MTD] Simplify NAND locking
[deliverable/linux.git] / include / linux / mtd / nand.h
CommitLineData
1da177e4
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1/*
2 * linux/include/linux/mtd/nand.h
3 *
4 * Copyright (c) 2000 David Woodhouse <dwmw2@mvhi.com>
5 * Steven J. Hill <sjhill@realitydiluted.com>
6 * Thomas Gleixner <tglx@linutronix.de>
7 *
962034f4 8 * $Id: nand.h,v 1.74 2005/09/15 13:58:50 vwool Exp $
1da177e4
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9 *
10 * This program is free software; you can redistribute it and/or modify
11 * it under the terms of the GNU General Public License version 2 as
12 * published by the Free Software Foundation.
13 *
14 * Info:
15 * Contains standard defines and IDs for NAND flash devices
16 *
17 * Changelog:
18 * 01-31-2000 DMW Created
19 * 09-18-2000 SJH Moved structure out of the Disk-On-Chip drivers
20 * so it can be used by other NAND flash device
21 * drivers. I also changed the copyright since none
22 * of the original contents of this file are specific
23 * to DoC devices. David can whack me with a baseball
24 * bat later if I did something naughty.
25 * 10-11-2000 SJH Added private NAND flash structure for driver
26 * 10-24-2000 SJH Added prototype for 'nand_scan' function
61ecfa87 27 * 10-29-2001 TG changed nand_chip structure to support
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28 * hardwarespecific function for accessing control lines
29 * 02-21-2002 TG added support for different read/write adress and
30 * ready/busy line access function
31 * 02-26-2002 TG added chip_delay to nand_chip structure to optimize
32 * command delay times for different chips
33 * 04-28-2002 TG OOB config defines moved from nand.c to avoid duplicate
34 * defines in jffs2/wbuf.c
35 * 08-07-2002 TG forced bad block location to byte 5 of OOB, even if
36 * CONFIG_MTD_NAND_ECC_JFFS2 is not set
37 * 08-10-2002 TG extensions to nand_chip structure to support HW-ECC
38 *
61ecfa87 39 * 08-29-2002 tglx nand_chip structure: data_poi for selecting
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40 * internal / fs-driver buffer
41 * support for 6byte/512byte hardware ECC
42 * read_ecc, write_ecc extended for different oob-layout
43 * oob layout selections: NAND_NONE_OOB, NAND_JFFS2_OOB,
44 * NAND_YAFFS_OOB
45 * 11-25-2002 tglx Added Manufacturer code FUJITSU, NATIONAL
61ecfa87 46 * Split manufacturer and device ID structures
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47 *
48 * 02-08-2004 tglx added option field to nand structure for chip anomalities
49 * 05-25-2004 tglx added bad block table support, ST-MICRO manufacturer id
50 * update of nand_chip structure description
61ecfa87 51 * 01-17-2005 dmarlin added extended commands for AG-AND device and added option
28a48de7 52 * for BBT_AUTO_REFRESH.
61ecfa87 53 * 01-20-2005 dmarlin added optional pointer to hardware specific callback for
068e3c0a 54 * extra error status checks.
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55 */
56#ifndef __LINUX_MTD_NAND_H
57#define __LINUX_MTD_NAND_H
58
59#include <linux/config.h>
60#include <linux/wait.h>
61#include <linux/spinlock.h>
62#include <linux/mtd/mtd.h>
63
64struct mtd_info;
65/* Scan and identify a NAND device */
66extern int nand_scan (struct mtd_info *mtd, int max_chips);
67/* Free resources held by the NAND device */
68extern void nand_release (struct mtd_info *mtd);
69
70/* Read raw data from the device without ECC */
71extern int nand_read_raw (struct mtd_info *mtd, uint8_t *buf, loff_t from, size_t len, size_t ooblen);
72
73
74/* The maximum number of NAND chips in an array */
75#define NAND_MAX_CHIPS 8
76
77/* This constant declares the max. oobsize / page, which
78 * is supported now. If you add a chip with bigger oobsize/page
79 * adjust this accordingly.
80 */
81#define NAND_MAX_OOBSIZE 64
82
83/*
84 * Constants for hardware specific CLE/ALE/NCE function
85*/
86/* Select the chip by setting nCE to low */
87#define NAND_CTL_SETNCE 1
88/* Deselect the chip by setting nCE to high */
89#define NAND_CTL_CLRNCE 2
90/* Select the command latch by setting CLE to high */
91#define NAND_CTL_SETCLE 3
92/* Deselect the command latch by setting CLE to low */
93#define NAND_CTL_CLRCLE 4
94/* Select the address latch by setting ALE to high */
95#define NAND_CTL_SETALE 5
96/* Deselect the address latch by setting ALE to low */
97#define NAND_CTL_CLRALE 6
98/* Set write protection by setting WP to high. Not used! */
99#define NAND_CTL_SETWP 7
100/* Clear write protection by setting WP to low. Not used! */
101#define NAND_CTL_CLRWP 8
102
103/*
104 * Standard NAND flash commands
105 */
106#define NAND_CMD_READ0 0
107#define NAND_CMD_READ1 1
108#define NAND_CMD_PAGEPROG 0x10
109#define NAND_CMD_READOOB 0x50
110#define NAND_CMD_ERASE1 0x60
111#define NAND_CMD_STATUS 0x70
112#define NAND_CMD_STATUS_MULTI 0x71
113#define NAND_CMD_SEQIN 0x80
114#define NAND_CMD_READID 0x90
115#define NAND_CMD_ERASE2 0xd0
116#define NAND_CMD_RESET 0xff
117
118/* Extended commands for large page devices */
119#define NAND_CMD_READSTART 0x30
120#define NAND_CMD_CACHEDPROG 0x15
121
28a48de7 122/* Extended commands for AG-AND device */
61ecfa87
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123/*
124 * Note: the command for NAND_CMD_DEPLETE1 is really 0x00 but
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125 * there is no way to distinguish that from NAND_CMD_READ0
126 * until the remaining sequence of commands has been completed
127 * so add a high order bit and mask it off in the command.
128 */
129#define NAND_CMD_DEPLETE1 0x100
130#define NAND_CMD_DEPLETE2 0x38
131#define NAND_CMD_STATUS_MULTI 0x71
132#define NAND_CMD_STATUS_ERROR 0x72
133/* multi-bank error status (banks 0-3) */
134#define NAND_CMD_STATUS_ERROR0 0x73
135#define NAND_CMD_STATUS_ERROR1 0x74
136#define NAND_CMD_STATUS_ERROR2 0x75
137#define NAND_CMD_STATUS_ERROR3 0x76
138#define NAND_CMD_STATUS_RESET 0x7f
139#define NAND_CMD_STATUS_CLEAR 0xff
140
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141/* Status bits */
142#define NAND_STATUS_FAIL 0x01
143#define NAND_STATUS_FAIL_N1 0x02
144#define NAND_STATUS_TRUE_READY 0x20
145#define NAND_STATUS_READY 0x40
146#define NAND_STATUS_WP 0x80
147
61ecfa87 148/*
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149 * Constants for ECC_MODES
150 */
151
152/* No ECC. Usage is not recommended ! */
153#define NAND_ECC_NONE 0
154/* Software ECC 3 byte ECC per 256 Byte data */
155#define NAND_ECC_SOFT 1
156/* Hardware ECC 3 byte ECC per 256 Byte data */
157#define NAND_ECC_HW3_256 2
158/* Hardware ECC 3 byte ECC per 512 Byte data */
159#define NAND_ECC_HW3_512 3
160/* Hardware ECC 3 byte ECC per 512 Byte data */
161#define NAND_ECC_HW6_512 4
162/* Hardware ECC 8 byte ECC per 512 Byte data */
163#define NAND_ECC_HW8_512 6
164/* Hardware ECC 12 byte ECC per 2048 Byte data */
165#define NAND_ECC_HW12_2048 7
166
167/*
168 * Constants for Hardware ECC
068e3c0a 169 */
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170/* Reset Hardware ECC for read */
171#define NAND_ECC_READ 0
172/* Reset Hardware ECC for write */
173#define NAND_ECC_WRITE 1
174/* Enable Hardware ECC before syndrom is read back from flash */
175#define NAND_ECC_READSYN 2
176
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177/* Bit mask for flags passed to do_nand_read_ecc */
178#define NAND_GET_DEVICE 0x80
179
180
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181/* Option constants for bizarre disfunctionality and real
182* features
183*/
184/* Chip can not auto increment pages */
185#define NAND_NO_AUTOINCR 0x00000001
186/* Buswitdh is 16 bit */
187#define NAND_BUSWIDTH_16 0x00000002
188/* Device supports partial programming without padding */
189#define NAND_NO_PADDING 0x00000004
190/* Chip has cache program function */
191#define NAND_CACHEPRG 0x00000008
192/* Chip has copy back function */
193#define NAND_COPYBACK 0x00000010
61ecfa87 194/* AND Chip which has 4 banks and a confusing page / block
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195 * assignment. See Renesas datasheet for further information */
196#define NAND_IS_AND 0x00000020
197/* Chip has a array of 4 pages which can be read without
198 * additional ready /busy waits */
61ecfa87 199#define NAND_4PAGE_ARRAY 0x00000040
28a48de7
DM
200/* Chip requires that BBT is periodically rewritten to prevent
201 * bits from adjacent blocks from 'leaking' in altering data.
202 * This happens with the Renesas AG-AND chips, possibly others. */
203#define BBT_AUTO_REFRESH 0x00000080
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204
205/* Options valid for Samsung large page devices */
206#define NAND_SAMSUNG_LP_OPTIONS \
207 (NAND_NO_PADDING | NAND_CACHEPRG | NAND_COPYBACK)
208
209/* Macros to identify the above */
210#define NAND_CANAUTOINCR(chip) (!(chip->options & NAND_NO_AUTOINCR))
211#define NAND_MUST_PAD(chip) (!(chip->options & NAND_NO_PADDING))
212#define NAND_HAS_CACHEPROG(chip) ((chip->options & NAND_CACHEPRG))
213#define NAND_HAS_COPYBACK(chip) ((chip->options & NAND_COPYBACK))
214
215/* Mask to zero out the chip options, which come from the id table */
216#define NAND_CHIPOPTIONS_MSK (0x0000ffff & ~NAND_NO_AUTOINCR)
217
218/* Non chip related options */
219/* Use a flash based bad block table. This option is passed to the
220 * default bad block table function. */
221#define NAND_USE_FLASH_BBT 0x00010000
61ecfa87
TG
222/* The hw ecc generator provides a syndrome instead a ecc value on read
223 * This can only work if we have the ecc bytes directly behind the
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224 * data bytes. Applies for DOC and AG-AND Renesas HW Reed Solomon generators */
225#define NAND_HWECC_SYNDROME 0x00020000
0040bf38
TG
226/* This option skips the bbt scan during initialization. */
227#define NAND_SKIP_BBTSCAN 0x00040000
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228
229/* Options set by nand scan */
a36ed299
TG
230/* Nand scan has allocated controller struct */
231#define NAND_CONTROLLER_ALLOC 0x20000000
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232/* Nand scan has allocated oob_buf */
233#define NAND_OOBBUF_ALLOC 0x40000000
234/* Nand scan has allocated data_buf */
235#define NAND_DATABUF_ALLOC 0x80000000
236
237
238/*
239 * nand_state_t - chip states
240 * Enumeration for NAND flash chip state
241 */
242typedef enum {
243 FL_READY,
244 FL_READING,
245 FL_WRITING,
246 FL_ERASING,
247 FL_SYNCING,
248 FL_CACHEDPRG,
962034f4 249 FL_PM_SUSPENDED,
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250} nand_state_t;
251
252/* Keep gcc happy */
253struct nand_chip;
254
255/**
256 * struct nand_hw_control - Control structure for hardware controller (e.g ECC generator) shared among independend devices
61ecfa87 257 * @lock: protection lock
1da177e4 258 * @active: the mtd device which holds the controller currently
0dfc6246
TG
259 * @wq: wait queue to sleep on if a NAND operation is in progress
260 * used instead of the per chip wait queue when a hw controller is available
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261 */
262struct nand_hw_control {
263 spinlock_t lock;
264 struct nand_chip *active;
0dfc6246 265 wait_queue_head_t wq;
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266};
267
268/**
269 * struct nand_chip - NAND Private Flash Chip Data
61ecfa87
TG
270 * @IO_ADDR_R: [BOARDSPECIFIC] address to read the 8 I/O lines of the flash device
271 * @IO_ADDR_W: [BOARDSPECIFIC] address to write the 8 I/O lines of the flash device
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272 * @read_byte: [REPLACEABLE] read one byte from the chip
273 * @write_byte: [REPLACEABLE] write one byte to the chip
274 * @read_word: [REPLACEABLE] read one word from the chip
275 * @write_word: [REPLACEABLE] write one word to the chip
276 * @write_buf: [REPLACEABLE] write data from the buffer to the chip
277 * @read_buf: [REPLACEABLE] read data from the chip into the buffer
278 * @verify_buf: [REPLACEABLE] verify buffer contents against the chip data
279 * @select_chip: [REPLACEABLE] select chip nr
280 * @block_bad: [REPLACEABLE] check, if the block is bad
281 * @block_markbad: [REPLACEABLE] mark the block bad
282 * @hwcontrol: [BOARDSPECIFIC] hardwarespecific function for accesing control-lines
283 * @dev_ready: [BOARDSPECIFIC] hardwarespecific function for accesing device ready/busy line
284 * If set to NULL no access to ready/busy is available and the ready/busy information
285 * is read from the chip status register
286 * @cmdfunc: [REPLACEABLE] hardwarespecific function for writing commands to the chip
287 * @waitfunc: [REPLACEABLE] hardwarespecific function for wait on ready
288 * @calculate_ecc: [REPLACEABLE] function for ecc calculation or readback from ecc hardware
289 * @correct_data: [REPLACEABLE] function for ecc correction, matching to ecc generator (sw/hw)
290 * @enable_hwecc: [BOARDSPECIFIC] function to enable (reset) hardware ecc generator. Must only
291 * be provided if a hardware ECC is available
292 * @erase_cmd: [INTERN] erase command write function, selectable due to AND support
293 * @scan_bbt: [REPLACEABLE] function to scan bad block table
61ecfa87 294 * @eccmode: [BOARDSPECIFIC] mode of ecc, see defines
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295 * @eccsize: [INTERN] databytes used per ecc-calculation
296 * @eccbytes: [INTERN] number of ecc bytes per ecc-calculation step
297 * @eccsteps: [INTERN] number of ecc calculation steps per page
298 * @chip_delay: [BOARDSPECIFIC] chip dependent delay for transfering data from array to read regs (tR)
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299 * @wq: [INTERN] wait queue to sleep on if a NAND operation is in progress
300 * @state: [INTERN] the current state of the NAND device
301 * @page_shift: [INTERN] number of address bits in a page (column address bits)
302 * @phys_erase_shift: [INTERN] number of address bits in a physical eraseblock
303 * @bbt_erase_shift: [INTERN] number of address bits in a bbt entry
304 * @chip_shift: [INTERN] number of address bits in one chip
61ecfa87 305 * @data_buf: [INTERN] internal buffer for one page + oob
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306 * @oob_buf: [INTERN] oob buffer for one eraseblock
307 * @oobdirty: [INTERN] indicates that oob_buf must be reinitialized
308 * @data_poi: [INTERN] pointer to a data buffer
309 * @options: [BOARDSPECIFIC] various chip options. They can partly be set to inform nand_scan about
310 * special functionality. See the defines for further explanation
311 * @badblockpos: [INTERN] position of the bad block marker in the oob area
312 * @numchips: [INTERN] number of physical chips
313 * @chipsize: [INTERN] the size of one chip for multichip arrays
314 * @pagemask: [INTERN] page number mask = number of (pages / chip) - 1
315 * @pagebuf: [INTERN] holds the pagenumber which is currently in data_buf
316 * @autooob: [REPLACEABLE] the default (auto)placement scheme
317 * @bbt: [INTERN] bad block table pointer
318 * @bbt_td: [REPLACEABLE] bad block table descriptor for flash lookup
319 * @bbt_md: [REPLACEABLE] bad block table mirror descriptor
61ecfa87 320 * @badblock_pattern: [REPLACEABLE] bad block scan pattern used for initial bad block scan
a36ed299
TG
321 * @controller: [REPLACEABLE] a pointer to a hardware controller structure
322 * which is shared among multiple independend devices
1da177e4 323 * @priv: [OPTIONAL] pointer to private chip date
61ecfa87 324 * @errstat: [OPTIONAL] hardware specific function to perform additional error status checks
068e3c0a 325 * (determine if errors are correctable)
1da177e4 326 */
61ecfa87 327
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328struct nand_chip {
329 void __iomem *IO_ADDR_R;
330 void __iomem *IO_ADDR_W;
61ecfa87 331
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332 u_char (*read_byte)(struct mtd_info *mtd);
333 void (*write_byte)(struct mtd_info *mtd, u_char byte);
334 u16 (*read_word)(struct mtd_info *mtd);
335 void (*write_word)(struct mtd_info *mtd, u16 word);
61ecfa87 336
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337 void (*write_buf)(struct mtd_info *mtd, const u_char *buf, int len);
338 void (*read_buf)(struct mtd_info *mtd, u_char *buf, int len);
339 int (*verify_buf)(struct mtd_info *mtd, const u_char *buf, int len);
340 void (*select_chip)(struct mtd_info *mtd, int chip);
341 int (*block_bad)(struct mtd_info *mtd, loff_t ofs, int getchip);
342 int (*block_markbad)(struct mtd_info *mtd, loff_t ofs);
343 void (*hwcontrol)(struct mtd_info *mtd, int cmd);
344 int (*dev_ready)(struct mtd_info *mtd);
345 void (*cmdfunc)(struct mtd_info *mtd, unsigned command, int column, int page_addr);
346 int (*waitfunc)(struct mtd_info *mtd, struct nand_chip *this, int state);
347 int (*calculate_ecc)(struct mtd_info *mtd, const u_char *dat, u_char *ecc_code);
348 int (*correct_data)(struct mtd_info *mtd, u_char *dat, u_char *read_ecc, u_char *calc_ecc);
349 void (*enable_hwecc)(struct mtd_info *mtd, int mode);
350 void (*erase_cmd)(struct mtd_info *mtd, int page);
351 int (*scan_bbt)(struct mtd_info *mtd);
352 int eccmode;
353 int eccsize;
354 int eccbytes;
355 int eccsteps;
356 int chip_delay;
1da177e4
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357 wait_queue_head_t wq;
358 nand_state_t state;
359 int page_shift;
360 int phys_erase_shift;
361 int bbt_erase_shift;
362 int chip_shift;
363 u_char *data_buf;
364 u_char *oob_buf;
365 int oobdirty;
366 u_char *data_poi;
367 unsigned int options;
368 int badblockpos;
369 int numchips;
370 unsigned long chipsize;
371 int pagemask;
372 int pagebuf;
373 struct nand_oobinfo *autooob;
374 uint8_t *bbt;
375 struct nand_bbt_descr *bbt_td;
376 struct nand_bbt_descr *bbt_md;
377 struct nand_bbt_descr *badblock_pattern;
378 struct nand_hw_control *controller;
379 void *priv;
068e3c0a 380 int (*errstat)(struct mtd_info *mtd, struct nand_chip *this, int state, int status, int page);
1da177e4
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381};
382
383/*
384 * NAND Flash Manufacturer ID Codes
385 */
386#define NAND_MFR_TOSHIBA 0x98
387#define NAND_MFR_SAMSUNG 0xec
388#define NAND_MFR_FUJITSU 0x04
389#define NAND_MFR_NATIONAL 0x8f
390#define NAND_MFR_RENESAS 0x07
391#define NAND_MFR_STMICRO 0x20
f1f67a98 392#define NAND_MFR_HYNIX 0xad
1da177e4
LT
393
394/**
395 * struct nand_flash_dev - NAND Flash Device ID Structure
396 *
397 * @name: Identify the device type
398 * @id: device ID code
399 * @pagesize: Pagesize in bytes. Either 256 or 512 or 0
61ecfa87 400 * If the pagesize is 0, then the real pagesize
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401 * and the eraseize are determined from the
402 * extended id bytes in the chip
403 * @erasesize: Size of an erase block in the flash device.
404 * @chipsize: Total chipsize in Mega Bytes
405 * @options: Bitfield to store chip relevant options
406 */
407struct nand_flash_dev {
408 char *name;
409 int id;
410 unsigned long pagesize;
411 unsigned long chipsize;
412 unsigned long erasesize;
413 unsigned long options;
414};
415
416/**
417 * struct nand_manufacturers - NAND Flash Manufacturer ID Structure
418 * @name: Manufacturer name
419 * @id: manufacturer ID code of device.
420*/
421struct nand_manufacturers {
422 int id;
423 char * name;
424};
425
426extern struct nand_flash_dev nand_flash_ids[];
427extern struct nand_manufacturers nand_manuf_ids[];
428
61ecfa87 429/**
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430 * struct nand_bbt_descr - bad block table descriptor
431 * @options: options for this descriptor
432 * @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE
433 * when bbt is searched, then we store the found bbts pages here.
434 * Its an array and supports up to 8 chips now
435 * @offs: offset of the pattern in the oob area of the page
436 * @veroffs: offset of the bbt version counter in the oob are of the page
437 * @version: version read from the bbt page during scan
438 * @len: length of the pattern, if 0 no pattern check is performed
439 * @maxblocks: maximum number of blocks to search for a bbt. This number of
61ecfa87 440 * blocks is reserved at the end of the device where the tables are
1da177e4
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441 * written.
442 * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than
443 * bad) block in the stored bbt
61ecfa87 444 * @pattern: pattern to identify bad block table or factory marked good /
1da177e4
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445 * bad blocks, can be NULL, if len = 0
446 *
61ecfa87 447 * Descriptor for the bad block table marker and the descriptor for the
1da177e4
LT
448 * pattern which identifies good and bad blocks. The assumption is made
449 * that the pattern and the version count are always located in the oob area
450 * of the first block.
451 */
452struct nand_bbt_descr {
453 int options;
454 int pages[NAND_MAX_CHIPS];
455 int offs;
456 int veroffs;
457 uint8_t version[NAND_MAX_CHIPS];
458 int len;
459 int maxblocks;
460 int reserved_block_code;
461 uint8_t *pattern;
462};
463
464/* Options for the bad block table descriptors */
465
466/* The number of bits used per block in the bbt on the device */
467#define NAND_BBT_NRBITS_MSK 0x0000000F
468#define NAND_BBT_1BIT 0x00000001
469#define NAND_BBT_2BIT 0x00000002
470#define NAND_BBT_4BIT 0x00000004
471#define NAND_BBT_8BIT 0x00000008
472/* The bad block table is in the last good block of the device */
473#define NAND_BBT_LASTBLOCK 0x00000010
474/* The bbt is at the given page, else we must scan for the bbt */
475#define NAND_BBT_ABSPAGE 0x00000020
476/* The bbt is at the given page, else we must scan for the bbt */
477#define NAND_BBT_SEARCH 0x00000040
478/* bbt is stored per chip on multichip devices */
479#define NAND_BBT_PERCHIP 0x00000080
480/* bbt has a version counter at offset veroffs */
481#define NAND_BBT_VERSION 0x00000100
482/* Create a bbt if none axists */
483#define NAND_BBT_CREATE 0x00000200
484/* Search good / bad pattern through all pages of a block */
485#define NAND_BBT_SCANALLPAGES 0x00000400
486/* Scan block empty during good / bad block scan */
487#define NAND_BBT_SCANEMPTY 0x00000800
488/* Write bbt if neccecary */
489#define NAND_BBT_WRITE 0x00001000
490/* Read and write back block contents when writing bbt */
491#define NAND_BBT_SAVECONTENT 0x00002000
492/* Search good / bad pattern on the first and the second page */
493#define NAND_BBT_SCAN2NDPAGE 0x00004000
494
495/* The maximum number of blocks to scan for a bbt */
496#define NAND_BBT_SCAN_MAXBLOCKS 4
497
498extern int nand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd);
499extern int nand_update_bbt (struct mtd_info *mtd, loff_t offs);
500extern int nand_default_bbt (struct mtd_info *mtd);
501extern int nand_isbad_bbt (struct mtd_info *mtd, loff_t offs, int allowbbt);
502extern int nand_erase_nand (struct mtd_info *mtd, struct erase_info *instr, int allowbbt);
068e3c0a
DM
503extern int nand_do_read_ecc (struct mtd_info *mtd, loff_t from, size_t len,
504 size_t * retlen, u_char * buf, u_char * oob_buf,
505 struct nand_oobinfo *oobsel, int flags);
1da177e4
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506
507/*
508* Constants for oob configuration
509*/
510#define NAND_SMALL_BADBLOCK_POS 5
511#define NAND_LARGE_BADBLOCK_POS 0
512
513#endif /* __LINUX_MTD_NAND_H */
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