[MTD] Remove PCI dependency for Geode CS553[56] NAND controller.
[deliverable/linux.git] / include / linux / mtd / nand.h
CommitLineData
1da177e4
LT
1/*
2 * linux/include/linux/mtd/nand.h
3 *
4 * Copyright (c) 2000 David Woodhouse <dwmw2@mvhi.com>
5 * Steven J. Hill <sjhill@realitydiluted.com>
6 * Thomas Gleixner <tglx@linutronix.de>
7 *
962034f4 8 * $Id: nand.h,v 1.74 2005/09/15 13:58:50 vwool Exp $
1da177e4
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9 *
10 * This program is free software; you can redistribute it and/or modify
11 * it under the terms of the GNU General Public License version 2 as
12 * published by the Free Software Foundation.
13 *
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14 * Info:
15 * Contains standard defines and IDs for NAND flash devices
1da177e4 16 *
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17 * Changelog:
18 * See git changelog.
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19 */
20#ifndef __LINUX_MTD_NAND_H
21#define __LINUX_MTD_NAND_H
22
23#include <linux/config.h>
24#include <linux/wait.h>
25#include <linux/spinlock.h>
26#include <linux/mtd/mtd.h>
27
28struct mtd_info;
29/* Scan and identify a NAND device */
30extern int nand_scan (struct mtd_info *mtd, int max_chips);
31/* Free resources held by the NAND device */
32extern void nand_release (struct mtd_info *mtd);
33
34/* Read raw data from the device without ECC */
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35extern int nand_read_raw (struct mtd_info *mtd, uint8_t *buf, loff_t from,
36 size_t len, size_t ooblen);
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37
38
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39extern int nand_write_raw(struct mtd_info *mtd, loff_t to, size_t len,
40 size_t *retlen, uint8_t *buf, uint8_t *oob);
41
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42/* The maximum number of NAND chips in an array */
43#define NAND_MAX_CHIPS 8
44
45/* This constant declares the max. oobsize / page, which
46 * is supported now. If you add a chip with bigger oobsize/page
47 * adjust this accordingly.
48 */
49#define NAND_MAX_OOBSIZE 64
50
51/*
52 * Constants for hardware specific CLE/ALE/NCE function
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53 *
54 * These are bits which can be or'ed to set/clear multiple
55 * bits in one go.
56 */
1da177e4 57/* Select the chip by setting nCE to low */
7abd3ef9 58#define NAND_NCE 0x01
1da177e4 59/* Select the command latch by setting CLE to high */
7abd3ef9 60#define NAND_CLE 0x02
1da177e4 61/* Select the address latch by setting ALE to high */
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62#define NAND_ALE 0x04
63
64#define NAND_CTRL_CLE (NAND_NCE | NAND_CLE)
65#define NAND_CTRL_ALE (NAND_NCE | NAND_ALE)
66#define NAND_CTRL_CHANGE 0x80
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67
68/*
69 * Standard NAND flash commands
70 */
71#define NAND_CMD_READ0 0
72#define NAND_CMD_READ1 1
73#define NAND_CMD_PAGEPROG 0x10
74#define NAND_CMD_READOOB 0x50
75#define NAND_CMD_ERASE1 0x60
76#define NAND_CMD_STATUS 0x70
77#define NAND_CMD_STATUS_MULTI 0x71
78#define NAND_CMD_SEQIN 0x80
79#define NAND_CMD_READID 0x90
80#define NAND_CMD_ERASE2 0xd0
81#define NAND_CMD_RESET 0xff
82
83/* Extended commands for large page devices */
84#define NAND_CMD_READSTART 0x30
85#define NAND_CMD_CACHEDPROG 0x15
86
28a48de7 87/* Extended commands for AG-AND device */
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88/*
89 * Note: the command for NAND_CMD_DEPLETE1 is really 0x00 but
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90 * there is no way to distinguish that from NAND_CMD_READ0
91 * until the remaining sequence of commands has been completed
92 * so add a high order bit and mask it off in the command.
93 */
94#define NAND_CMD_DEPLETE1 0x100
95#define NAND_CMD_DEPLETE2 0x38
96#define NAND_CMD_STATUS_MULTI 0x71
97#define NAND_CMD_STATUS_ERROR 0x72
98/* multi-bank error status (banks 0-3) */
99#define NAND_CMD_STATUS_ERROR0 0x73
100#define NAND_CMD_STATUS_ERROR1 0x74
101#define NAND_CMD_STATUS_ERROR2 0x75
102#define NAND_CMD_STATUS_ERROR3 0x76
103#define NAND_CMD_STATUS_RESET 0x7f
104#define NAND_CMD_STATUS_CLEAR 0xff
105
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106#define NAND_CMD_NONE -1
107
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108/* Status bits */
109#define NAND_STATUS_FAIL 0x01
110#define NAND_STATUS_FAIL_N1 0x02
111#define NAND_STATUS_TRUE_READY 0x20
112#define NAND_STATUS_READY 0x40
113#define NAND_STATUS_WP 0x80
114
61ecfa87 115/*
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116 * Constants for ECC_MODES
117 */
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118typedef enum {
119 NAND_ECC_NONE,
120 NAND_ECC_SOFT,
121 NAND_ECC_HW,
122 NAND_ECC_HW_SYNDROME,
123} nand_ecc_modes_t;
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124
125/*
126 * Constants for Hardware ECC
068e3c0a 127 */
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128/* Reset Hardware ECC for read */
129#define NAND_ECC_READ 0
130/* Reset Hardware ECC for write */
131#define NAND_ECC_WRITE 1
132/* Enable Hardware ECC before syndrom is read back from flash */
133#define NAND_ECC_READSYN 2
134
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135/* Bit mask for flags passed to do_nand_read_ecc */
136#define NAND_GET_DEVICE 0x80
137
138
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139/* Option constants for bizarre disfunctionality and real
140* features
141*/
142/* Chip can not auto increment pages */
143#define NAND_NO_AUTOINCR 0x00000001
144/* Buswitdh is 16 bit */
145#define NAND_BUSWIDTH_16 0x00000002
146/* Device supports partial programming without padding */
147#define NAND_NO_PADDING 0x00000004
148/* Chip has cache program function */
149#define NAND_CACHEPRG 0x00000008
150/* Chip has copy back function */
151#define NAND_COPYBACK 0x00000010
61ecfa87 152/* AND Chip which has 4 banks and a confusing page / block
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153 * assignment. See Renesas datasheet for further information */
154#define NAND_IS_AND 0x00000020
155/* Chip has a array of 4 pages which can be read without
156 * additional ready /busy waits */
61ecfa87 157#define NAND_4PAGE_ARRAY 0x00000040
28a48de7
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158/* Chip requires that BBT is periodically rewritten to prevent
159 * bits from adjacent blocks from 'leaking' in altering data.
160 * This happens with the Renesas AG-AND chips, possibly others. */
161#define BBT_AUTO_REFRESH 0x00000080
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162/* Chip does not require ready check on read. True
163 * for all large page devices, as they do not support
164 * autoincrement.*/
165#define NAND_NO_READRDY 0x00000100
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166
167/* Options valid for Samsung large page devices */
168#define NAND_SAMSUNG_LP_OPTIONS \
169 (NAND_NO_PADDING | NAND_CACHEPRG | NAND_COPYBACK)
170
171/* Macros to identify the above */
172#define NAND_CANAUTOINCR(chip) (!(chip->options & NAND_NO_AUTOINCR))
173#define NAND_MUST_PAD(chip) (!(chip->options & NAND_NO_PADDING))
174#define NAND_HAS_CACHEPROG(chip) ((chip->options & NAND_CACHEPRG))
175#define NAND_HAS_COPYBACK(chip) ((chip->options & NAND_COPYBACK))
176
177/* Mask to zero out the chip options, which come from the id table */
178#define NAND_CHIPOPTIONS_MSK (0x0000ffff & ~NAND_NO_AUTOINCR)
179
180/* Non chip related options */
181/* Use a flash based bad block table. This option is passed to the
182 * default bad block table function. */
183#define NAND_USE_FLASH_BBT 0x00010000
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184/* The hw ecc generator provides a syndrome instead a ecc value on read
185 * This can only work if we have the ecc bytes directly behind the
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186 * data bytes. Applies for DOC and AG-AND Renesas HW Reed Solomon generators */
187#define NAND_HWECC_SYNDROME 0x00020000
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188/* This option skips the bbt scan during initialization. */
189#define NAND_SKIP_BBTSCAN 0x00040000
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190
191/* Options set by nand scan */
a36ed299
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192/* Nand scan has allocated controller struct */
193#define NAND_CONTROLLER_ALLOC 0x20000000
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194/* Nand scan has allocated oob_buf */
195#define NAND_OOBBUF_ALLOC 0x40000000
196/* Nand scan has allocated data_buf */
197#define NAND_DATABUF_ALLOC 0x80000000
198
199
200/*
201 * nand_state_t - chip states
202 * Enumeration for NAND flash chip state
203 */
204typedef enum {
205 FL_READY,
206 FL_READING,
207 FL_WRITING,
208 FL_ERASING,
209 FL_SYNCING,
210 FL_CACHEDPRG,
962034f4 211 FL_PM_SUSPENDED,
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212} nand_state_t;
213
214/* Keep gcc happy */
215struct nand_chip;
216
217/**
218 * struct nand_hw_control - Control structure for hardware controller (e.g ECC generator) shared among independend devices
61ecfa87 219 * @lock: protection lock
1da177e4 220 * @active: the mtd device which holds the controller currently
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221 * @wq: wait queue to sleep on if a NAND operation is in progress
222 * used instead of the per chip wait queue when a hw controller is available
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223 */
224struct nand_hw_control {
225 spinlock_t lock;
226 struct nand_chip *active;
0dfc6246 227 wait_queue_head_t wq;
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228};
229
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230/**
231 * struct nand_ecc_ctrl - Control structure for ecc
232 * @mode: ecc mode
233 * @steps: number of ecc steps per page
234 * @size: data bytes per ecc step
235 * @bytes: ecc bytes per step
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236 * @total: total number of ecc bytes per page
237 * @prepad: padding information for syndrome based ecc generators
238 * @postpad: padding information for syndrome based ecc generators
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239 * @hwctl: function to control hardware ecc generator. Must only
240 * be provided if an hardware ECC is available
241 * @calculate: function for ecc calculation or readback from ecc hardware
242 * @correct: function for ecc correction, matching to ecc generator (sw/hw)
9577f44a 243 * @write_page: function to write a page according to the ecc generator requirements
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TG
244 */
245struct nand_ecc_ctrl {
246 nand_ecc_modes_t mode;
247 int steps;
248 int size;
249 int bytes;
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TG
250 int total;
251 int prepad;
252 int postpad;
9a57d470 253 void (*hwctl)(struct mtd_info *mtd, int mode);
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254 int (*calculate)(struct mtd_info *mtd,
255 const uint8_t *dat,
256 uint8_t *ecc_code);
257 int (*correct)(struct mtd_info *mtd, uint8_t *dat,
258 uint8_t *read_ecc,
259 uint8_t *calc_ecc);
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260 int (*read_page)(struct mtd_info *mtd,
261 struct nand_chip *chip,
262 uint8_t *buf);
263 int (*write_page)(struct mtd_info *mtd,
264 struct nand_chip *chip,
265 uint8_t *buf, int cached);
6dfc6d25
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266};
267
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268/**
269 * struct nand_chip - NAND Private Flash Chip Data
61ecfa87
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270 * @IO_ADDR_R: [BOARDSPECIFIC] address to read the 8 I/O lines of the flash device
271 * @IO_ADDR_W: [BOARDSPECIFIC] address to write the 8 I/O lines of the flash device
1da177e4 272 * @read_byte: [REPLACEABLE] read one byte from the chip
1da177e4 273 * @read_word: [REPLACEABLE] read one word from the chip
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274 * @write_buf: [REPLACEABLE] write data from the buffer to the chip
275 * @read_buf: [REPLACEABLE] read data from the chip into the buffer
276 * @verify_buf: [REPLACEABLE] verify buffer contents against the chip data
277 * @select_chip: [REPLACEABLE] select chip nr
278 * @block_bad: [REPLACEABLE] check, if the block is bad
279 * @block_markbad: [REPLACEABLE] mark the block bad
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280 * @cmd_ctrl: [BOARDSPECIFIC] hardwarespecific funtion for controlling
281 * ALE/CLE/nCE. Also used to write command and address
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282 * @dev_ready: [BOARDSPECIFIC] hardwarespecific function for accesing device ready/busy line
283 * If set to NULL no access to ready/busy is available and the ready/busy information
284 * is read from the chip status register
285 * @cmdfunc: [REPLACEABLE] hardwarespecific function for writing commands to the chip
286 * @waitfunc: [REPLACEABLE] hardwarespecific function for wait on ready
6dfc6d25 287 * @ecc: [BOARDSPECIFIC] ecc control ctructure
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288 * @erase_cmd: [INTERN] erase command write function, selectable due to AND support
289 * @scan_bbt: [REPLACEABLE] function to scan bad block table
1da177e4 290 * @chip_delay: [BOARDSPECIFIC] chip dependent delay for transfering data from array to read regs (tR)
1da177e4 291 * @wq: [INTERN] wait queue to sleep on if a NAND operation is in progress
2c0a2bed 292 * @state: [INTERN] the current state of the NAND device
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293 * @page_shift: [INTERN] number of address bits in a page (column address bits)
294 * @phys_erase_shift: [INTERN] number of address bits in a physical eraseblock
295 * @bbt_erase_shift: [INTERN] number of address bits in a bbt entry
296 * @chip_shift: [INTERN] number of address bits in one chip
61ecfa87 297 * @data_buf: [INTERN] internal buffer for one page + oob
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298 * @oob_buf: [INTERN] oob buffer for one eraseblock
299 * @oobdirty: [INTERN] indicates that oob_buf must be reinitialized
300 * @data_poi: [INTERN] pointer to a data buffer
301 * @options: [BOARDSPECIFIC] various chip options. They can partly be set to inform nand_scan about
302 * special functionality. See the defines for further explanation
303 * @badblockpos: [INTERN] position of the bad block marker in the oob area
304 * @numchips: [INTERN] number of physical chips
305 * @chipsize: [INTERN] the size of one chip for multichip arrays
306 * @pagemask: [INTERN] page number mask = number of (pages / chip) - 1
307 * @pagebuf: [INTERN] holds the pagenumber which is currently in data_buf
308 * @autooob: [REPLACEABLE] the default (auto)placement scheme
309 * @bbt: [INTERN] bad block table pointer
310 * @bbt_td: [REPLACEABLE] bad block table descriptor for flash lookup
311 * @bbt_md: [REPLACEABLE] bad block table mirror descriptor
61ecfa87 312 * @badblock_pattern: [REPLACEABLE] bad block scan pattern used for initial bad block scan
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313 * @controller: [REPLACEABLE] a pointer to a hardware controller structure
314 * which is shared among multiple independend devices
1da177e4 315 * @priv: [OPTIONAL] pointer to private chip date
61ecfa87 316 * @errstat: [OPTIONAL] hardware specific function to perform additional error status checks
068e3c0a 317 * (determine if errors are correctable)
1da177e4 318 */
61ecfa87 319
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320struct nand_chip {
321 void __iomem *IO_ADDR_R;
2c0a2bed 322 void __iomem *IO_ADDR_W;
61ecfa87 323
58dd8f2b 324 uint8_t (*read_byte)(struct mtd_info *mtd);
1da177e4 325 u16 (*read_word)(struct mtd_info *mtd);
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TG
326 void (*write_buf)(struct mtd_info *mtd, const uint8_t *buf, int len);
327 void (*read_buf)(struct mtd_info *mtd, uint8_t *buf, int len);
328 int (*verify_buf)(struct mtd_info *mtd, const uint8_t *buf, int len);
1da177e4
LT
329 void (*select_chip)(struct mtd_info *mtd, int chip);
330 int (*block_bad)(struct mtd_info *mtd, loff_t ofs, int getchip);
331 int (*block_markbad)(struct mtd_info *mtd, loff_t ofs);
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332 void (*cmd_ctrl)(struct mtd_info *mtd, int dat,
333 unsigned int ctrl);
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TG
334 int (*dev_ready)(struct mtd_info *mtd);
335 void (*cmdfunc)(struct mtd_info *mtd, unsigned command, int column, int page_addr);
336 int (*waitfunc)(struct mtd_info *mtd, struct nand_chip *this, int state);
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337 void (*erase_cmd)(struct mtd_info *mtd, int page);
338 int (*scan_bbt)(struct mtd_info *mtd);
6dfc6d25 339 struct nand_ecc_ctrl ecc;
2c0a2bed 340 int chip_delay;
1da177e4 341 wait_queue_head_t wq;
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TG
342 nand_state_t state;
343 int page_shift;
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344 int phys_erase_shift;
345 int bbt_erase_shift;
346 int chip_shift;
58dd8f2b
TG
347 uint8_t *data_buf;
348 uint8_t *oob_buf;
1da177e4 349 int oobdirty;
58dd8f2b 350 uint8_t *data_poi;
1da177e4
LT
351 unsigned int options;
352 int badblockpos;
353 int numchips;
354 unsigned long chipsize;
355 int pagemask;
356 int pagebuf;
357 struct nand_oobinfo *autooob;
358 uint8_t *bbt;
359 struct nand_bbt_descr *bbt_td;
360 struct nand_bbt_descr *bbt_md;
361 struct nand_bbt_descr *badblock_pattern;
362 struct nand_hw_control *controller;
363 void *priv;
068e3c0a 364 int (*errstat)(struct mtd_info *mtd, struct nand_chip *this, int state, int status, int page);
1da177e4
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365};
366
367/*
368 * NAND Flash Manufacturer ID Codes
369 */
370#define NAND_MFR_TOSHIBA 0x98
371#define NAND_MFR_SAMSUNG 0xec
372#define NAND_MFR_FUJITSU 0x04
373#define NAND_MFR_NATIONAL 0x8f
374#define NAND_MFR_RENESAS 0x07
375#define NAND_MFR_STMICRO 0x20
2c0a2bed 376#define NAND_MFR_HYNIX 0xad
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377
378/**
379 * struct nand_flash_dev - NAND Flash Device ID Structure
380 *
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TG
381 * @name: Identify the device type
382 * @id: device ID code
383 * @pagesize: Pagesize in bytes. Either 256 or 512 or 0
61ecfa87 384 * If the pagesize is 0, then the real pagesize
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385 * and the eraseize are determined from the
386 * extended id bytes in the chip
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TG
387 * @erasesize: Size of an erase block in the flash device.
388 * @chipsize: Total chipsize in Mega Bytes
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389 * @options: Bitfield to store chip relevant options
390 */
391struct nand_flash_dev {
392 char *name;
393 int id;
394 unsigned long pagesize;
395 unsigned long chipsize;
396 unsigned long erasesize;
397 unsigned long options;
398};
399
400/**
401 * struct nand_manufacturers - NAND Flash Manufacturer ID Structure
402 * @name: Manufacturer name
2c0a2bed 403 * @id: manufacturer ID code of device.
1da177e4
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404*/
405struct nand_manufacturers {
406 int id;
407 char * name;
408};
409
410extern struct nand_flash_dev nand_flash_ids[];
411extern struct nand_manufacturers nand_manuf_ids[];
412
61ecfa87 413/**
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414 * struct nand_bbt_descr - bad block table descriptor
415 * @options: options for this descriptor
416 * @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE
417 * when bbt is searched, then we store the found bbts pages here.
418 * Its an array and supports up to 8 chips now
419 * @offs: offset of the pattern in the oob area of the page
420 * @veroffs: offset of the bbt version counter in the oob are of the page
421 * @version: version read from the bbt page during scan
422 * @len: length of the pattern, if 0 no pattern check is performed
423 * @maxblocks: maximum number of blocks to search for a bbt. This number of
61ecfa87 424 * blocks is reserved at the end of the device where the tables are
1da177e4
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425 * written.
426 * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than
427 * bad) block in the stored bbt
61ecfa87 428 * @pattern: pattern to identify bad block table or factory marked good /
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429 * bad blocks, can be NULL, if len = 0
430 *
61ecfa87 431 * Descriptor for the bad block table marker and the descriptor for the
1da177e4
LT
432 * pattern which identifies good and bad blocks. The assumption is made
433 * that the pattern and the version count are always located in the oob area
434 * of the first block.
435 */
436struct nand_bbt_descr {
437 int options;
438 int pages[NAND_MAX_CHIPS];
439 int offs;
440 int veroffs;
441 uint8_t version[NAND_MAX_CHIPS];
442 int len;
2c0a2bed 443 int maxblocks;
1da177e4
LT
444 int reserved_block_code;
445 uint8_t *pattern;
446};
447
448/* Options for the bad block table descriptors */
449
450/* The number of bits used per block in the bbt on the device */
451#define NAND_BBT_NRBITS_MSK 0x0000000F
452#define NAND_BBT_1BIT 0x00000001
453#define NAND_BBT_2BIT 0x00000002
454#define NAND_BBT_4BIT 0x00000004
455#define NAND_BBT_8BIT 0x00000008
456/* The bad block table is in the last good block of the device */
457#define NAND_BBT_LASTBLOCK 0x00000010
458/* The bbt is at the given page, else we must scan for the bbt */
459#define NAND_BBT_ABSPAGE 0x00000020
460/* The bbt is at the given page, else we must scan for the bbt */
461#define NAND_BBT_SEARCH 0x00000040
462/* bbt is stored per chip on multichip devices */
463#define NAND_BBT_PERCHIP 0x00000080
464/* bbt has a version counter at offset veroffs */
465#define NAND_BBT_VERSION 0x00000100
466/* Create a bbt if none axists */
467#define NAND_BBT_CREATE 0x00000200
468/* Search good / bad pattern through all pages of a block */
469#define NAND_BBT_SCANALLPAGES 0x00000400
470/* Scan block empty during good / bad block scan */
471#define NAND_BBT_SCANEMPTY 0x00000800
472/* Write bbt if neccecary */
473#define NAND_BBT_WRITE 0x00001000
474/* Read and write back block contents when writing bbt */
475#define NAND_BBT_SAVECONTENT 0x00002000
476/* Search good / bad pattern on the first and the second page */
477#define NAND_BBT_SCAN2NDPAGE 0x00004000
478
479/* The maximum number of blocks to scan for a bbt */
480#define NAND_BBT_SCAN_MAXBLOCKS 4
481
f5bbdacc
TG
482extern int nand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd);
483extern int nand_update_bbt(struct mtd_info *mtd, loff_t offs);
484extern int nand_default_bbt(struct mtd_info *mtd);
485extern int nand_isbad_bbt(struct mtd_info *mtd, loff_t offs, int allowbbt);
486extern int nand_erase_nand(struct mtd_info *mtd, struct erase_info *instr,
487 int allowbbt);
488extern int nand_do_read(struct mtd_info *mtd, loff_t from, size_t len,
489 size_t * retlen, uint8_t * buf);
1da177e4
LT
490
491/*
492* Constants for oob configuration
493*/
494#define NAND_SMALL_BADBLOCK_POS 5
495#define NAND_LARGE_BADBLOCK_POS 0
496
41796c2e
TG
497/**
498 * struct platform_nand_chip - chip level device structure
499 *
500 * @nr_chips: max. number of chips to scan for
501 * @chip_offs: chip number offset
502 * @nr_partitions: number of partitions pointed to be partitoons (or zero)
503 * @partitions: mtd partition list
504 * @chip_delay: R/B delay value in us
505 * @options: Option flags, e.g. 16bit buswidth
506 * @priv: hardware controller specific settings
507 */
508struct platform_nand_chip {
509 int nr_chips;
510 int chip_offset;
511 int nr_partitions;
512 struct mtd_partition *partitions;
2c0a2bed 513 int chip_delay;
41796c2e
TG
514 unsigned int options;
515 void *priv;
516};
517
518/**
519 * struct platform_nand_ctrl - controller level device structure
520 *
521 * @hwcontrol: platform specific hardware control structure
522 * @dev_ready: platform specific function to read ready/busy pin
523 * @select_chip: platform specific chip select function
524 * @priv_data: private data to transport driver specific settings
525 *
526 * All fields are optional and depend on the hardware driver requirements
527 */
528struct platform_nand_ctrl {
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TG
529 void (*hwcontrol)(struct mtd_info *mtd, int cmd);
530 int (*dev_ready)(struct mtd_info *mtd);
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TG
531 void (*select_chip)(struct mtd_info *mtd, int chip);
532 void *priv;
533};
534
535/* Some helpers to access the data structures */
536static inline
537struct platform_nand_chip *get_platform_nandchip(struct mtd_info *mtd)
538{
539 struct nand_chip *chip = mtd->priv;
540
541 return chip->priv;
542}
543
1da177e4 544#endif /* __LINUX_MTD_NAND_H */
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