#include <linux/wait.h>
#include <linux/spinlock.h>
#include <linux/mtd/mtd.h>
+#include <linux/mtd/flashchip.h>
+#include <linux/mtd/bbm.h>
struct mtd_info;
+struct nand_flash_dev;
/* Scan and identify a NAND device */
extern int nand_scan (struct mtd_info *mtd, int max_chips);
/* Separate phases of nand_scan(), allowing board driver to intervene
* and override command or ECC setup according to flash type */
-extern int nand_scan_ident(struct mtd_info *mtd, int max_chips);
+extern int nand_scan_ident(struct mtd_info *mtd, int max_chips,
+ struct nand_flash_dev *table);
extern int nand_scan_tail(struct mtd_info *mtd);
/* Free resources held by the NAND device */
/* Internal helper for board drivers which need to override command function */
extern void nand_wait_ready(struct mtd_info *mtd);
+/* locks all blockes present in the device */
+extern int nand_lock(struct mtd_info *mtd, loff_t ofs, uint64_t len);
+
+/* unlocks specified locked blockes */
+extern int nand_unlock(struct mtd_info *mtd, loff_t ofs, uint64_t len);
+
/* The maximum number of NAND chips in an array */
#define NAND_MAX_CHIPS 8
#define NAND_CMD_ERASE2 0xd0
#define NAND_CMD_RESET 0xff
+#define NAND_CMD_LOCK 0x2a
+#define NAND_CMD_UNLOCK1 0x23
+#define NAND_CMD_UNLOCK2 0x24
+
/* Extended commands for large page devices */
#define NAND_CMD_READSTART 0x30
#define NAND_CMD_RNDOUTSTART 0xE0
/* Chip does not allow subpage writes */
#define NAND_NO_SUBPAGE_WRITE 0x00000200
-
/* Options valid for Samsung large page devices */
#define NAND_SAMSUNG_LP_OPTIONS \
(NAND_NO_PADDING | NAND_CACHEPRG | NAND_COPYBACK)
/* This option is defined if the board driver allocates its own buffers
(e.g. because it needs them DMA-coherent */
#define NAND_OWN_BUFFERS 0x00040000
+/* Chip may not exist, so silence any errors in scan */
+#define NAND_SCAN_SILENT_NODEV 0x00080000
+
/* Options set by nand scan */
/* Nand scan has allocated controller struct */
#define NAND_CONTROLLER_ALLOC 0x80000000
#define NAND_CI_CHIPNR_MSK 0x03
#define NAND_CI_CELLTYPE_MSK 0x0C
-/*
- * nand_state_t - chip states
- * Enumeration for NAND flash chip state
- */
-typedef enum {
- FL_READY,
- FL_READING,
- FL_WRITING,
- FL_ERASING,
- FL_SYNCING,
- FL_CACHEDPRG,
- FL_PM_SUSPENDED,
-} nand_state_t;
-
/* Keep gcc happy */
struct nand_chip;
int subpagesize;
uint8_t cellinfo;
int badblockpos;
+ int badblockbits;
- nand_state_t state;
+ flstate_t state;
uint8_t *oob_poi;
struct nand_hw_control *controller;
extern struct nand_flash_dev nand_flash_ids[];
extern struct nand_manufacturers nand_manuf_ids[];
-/**
- * struct nand_bbt_descr - bad block table descriptor
- * @options: options for this descriptor
- * @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE
- * when bbt is searched, then we store the found bbts pages here.
- * Its an array and supports up to 8 chips now
- * @offs: offset of the pattern in the oob area of the page
- * @veroffs: offset of the bbt version counter in the oob are of the page
- * @version: version read from the bbt page during scan
- * @len: length of the pattern, if 0 no pattern check is performed
- * @maxblocks: maximum number of blocks to search for a bbt. This number of
- * blocks is reserved at the end of the device where the tables are
- * written.
- * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than
- * bad) block in the stored bbt
- * @pattern: pattern to identify bad block table or factory marked good /
- * bad blocks, can be NULL, if len = 0
- *
- * Descriptor for the bad block table marker and the descriptor for the
- * pattern which identifies good and bad blocks. The assumption is made
- * that the pattern and the version count are always located in the oob area
- * of the first block.
- */
-struct nand_bbt_descr {
- int options;
- int pages[NAND_MAX_CHIPS];
- int offs;
- int veroffs;
- uint8_t version[NAND_MAX_CHIPS];
- int len;
- int maxblocks;
- int reserved_block_code;
- uint8_t *pattern;
-};
-
-/* Options for the bad block table descriptors */
-
-/* The number of bits used per block in the bbt on the device */
-#define NAND_BBT_NRBITS_MSK 0x0000000F
-#define NAND_BBT_1BIT 0x00000001
-#define NAND_BBT_2BIT 0x00000002
-#define NAND_BBT_4BIT 0x00000004
-#define NAND_BBT_8BIT 0x00000008
-/* The bad block table is in the last good block of the device */
-#define NAND_BBT_LASTBLOCK 0x00000010
-/* The bbt is at the given page, else we must scan for the bbt */
-#define NAND_BBT_ABSPAGE 0x00000020
-/* The bbt is at the given page, else we must scan for the bbt */
-#define NAND_BBT_SEARCH 0x00000040
-/* bbt is stored per chip on multichip devices */
-#define NAND_BBT_PERCHIP 0x00000080
-/* bbt has a version counter at offset veroffs */
-#define NAND_BBT_VERSION 0x00000100
-/* Create a bbt if none axists */
-#define NAND_BBT_CREATE 0x00000200
-/* Search good / bad pattern through all pages of a block */
-#define NAND_BBT_SCANALLPAGES 0x00000400
-/* Scan block empty during good / bad block scan */
-#define NAND_BBT_SCANEMPTY 0x00000800
-/* Write bbt if neccecary */
-#define NAND_BBT_WRITE 0x00001000
-/* Read and write back block contents when writing bbt */
-#define NAND_BBT_SAVECONTENT 0x00002000
-/* Search good / bad pattern on the first and the second page */
-#define NAND_BBT_SCAN2NDPAGE 0x00004000
-
-/* The maximum number of blocks to scan for a bbt */
-#define NAND_BBT_SCAN_MAXBLOCKS 4
-
extern int nand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd);
extern int nand_update_bbt(struct mtd_info *mtd, loff_t offs);
extern int nand_default_bbt(struct mtd_info *mtd);
extern int nand_do_read(struct mtd_info *mtd, loff_t from, size_t len,
size_t * retlen, uint8_t * buf);
-/*
-* Constants for oob configuration
-*/
-#define NAND_SMALL_BADBLOCK_POS 5
-#define NAND_LARGE_BADBLOCK_POS 0
-
/**
* struct platform_nand_chip - chip level device structure
* @nr_chips: max. number of chips to scan for
projects / deliverable / linux.git / blobdiff