From: Felipe Balbi <balbi@ti.com>
Date: Wed, 26 Nov 2014 14:01:37 +0000 (-0600)
Subject: usb: musb: blackfin: fix build break
X-Git-Url: http://drtracing.org/?a=commitdiff_plain;h=b1d347830d811f3648a52d28700896c6c404d609;p=deliverable%2Flinux.git

usb: musb: blackfin: fix build break

commit cc92f681 (usb: musb: Populate new IO
functions for blackfin) added a typo which
prevented MUSB's blackfin glue layer from being
built. Due to lack of tests and compilers for
that architecture, the typo ended up being
merged and causing a build regression.

Fix that here

Cc: Tony Lindgren <tony@atomide.com>
Reported-by: Fengguang Wu <fengguang.wu@intel.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
---

diff --git a/drivers/usb/musb/blackfin.c b/drivers/usb/musb/blackfin.c
index a441a2de8619..178250145613 100644
--- a/drivers/usb/musb/blackfin.c
+++ b/drivers/usb/musb/blackfin.c
@@ -63,7 +63,7 @@ static void bfin_writew(void __iomem *addr, unsigned offset, u16 data)
 	bfin_write16(addr + offset, data);
 }
 
-static void binf_writel(void __iomem *addr, unsigned offset, u32 data)
+static void bfin_writel(void __iomem *addr, unsigned offset, u32 data)
 {
 	bfin_write16(addr + offset, (u16)data);
 }